Facilities
Highlights
Device Characterization Lab
The Device Characterization Lab (Rm 1373) is located in the first floor of the building. Equipment in the lab will be accessible to all MNTL users. Below are a list of equipment currently (or in near future) housed in the lab:
- Accent Hall Effect Measurement System
- Room temperature Probe Station
- Cryogenic Probe station
- Dip Pen Nanolithography tools (Nanoink)
- Philips X-ray Diffraction system
- InfraScope Micro-Thermal Imager (QFI)
- Agilent 4155B Semiconductor Parameter Analyzer
- Agilent 4263B LCR Meter (100Hz to 100kHz)
- Agilent 4395A Network/Spectrum/Impedance Analyzer (10Hz-500MHz)
- Agilent 33120A Function Generator 15MHz
- Agilent 34401A Digital Multimeter
Please contact Edmond Chow (echow@uiuc.edu ) if you have questions or comments.